1. Integrating reliability into Microelectronics Manufacturing
پدیدآورنده : Aris christou
کتابخانه: Library of Faculty of Management of Tehran University (Tehran)
موضوع : Microelectronics- Quality control
2. Optical inspection of microsystems
پدیدآورنده : / edited by Wolfgang Osten
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Quality control--Optical methods,Optical detectors--Industrial applications,Microelectronics.
رده :
TS156
.
2
.
O652
2007
3. Optical inspection of microsystems
پدیدآورنده : edited by Wolfgang Osten
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : ، Quality control -- Optical methods,Industrial applications ، Optical detectors,، Microelectronics
رده :
TS
156
.
2
.
O67
4. Optical inspection of microsystems
پدیدآورنده : edited by Wolfgang Osten
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : Optical methods ، Quality control,Industrial applications ، Optical detectors,، Microelectronics
رده :
TS
156
.
2
.
O652
2007
5. Optical inspection of microsystems
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Quality control ; Optical methods ; Optical detectors ; Industrial applications ; Microelectronics ;
6. Optical inspection of microsystems
پدیدآورنده : edited by Wolfgang Osten
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : Optical methods ، Quality control,Industrial applications ، Optical detectors,، Microelectronics
رده :
TS
156
.
2
.
O652
